NEW PRESSURE CALIBRATOR 40 BAR/600 PSI IN KARACHI
Description
Practical
The test pumps and pressure generators are designed to enable the direct connection of all pressure systems to be tested using adapters. The test sample is easily connected using the rugged industrial hose with integrated quick coupling and supplied adapters. The reference is fitted directly at the top of the pump using a positioning adapter.
The required test pressure is initially generated using the handles and then adjusted precisely with the fine adjustment valve. As a result, the pressure on both instruments is the same. The pressure relief valve allows continuous pressure reduction and ensures accurate and easy testing, even with decreasing pressure.
In the simplest case, the pressure is indicated by an analogue pressure gauge. An easy to read digital pressure gauge or hand-held instrument can also be used. The accuracy or adjustment of the pressure measuring device being tested can be checked by comparing the indicated reference value with the measured value for the device under test.
Practical
The test pumps and pressure generators are designed to enable the direct connection of all pressure systems to be tested using adapters. The test sample is easily connected using the rugged industrial hose with integrated quick coupling and supplied adapters. The reference is fitted directly at the top of the pump using a positioning adapter.
The required test pressure is initially generated using the handles and then adjusted precisely with the fine adjustment valve. As a result, the pressure on both instruments is the same. The pressure relief valve allows continuous pressure reduction and ensures accurate and easy testing, even with decreasing pressure.
In the simplest case, the pressure is indicated by an analogue pressure gauge. An easy to read digital pressure gauge or hand-held instrument can also be used. The accuracy or adjustment of the pressure measuring device being tested can be checked by comparing the indicated reference value with the measured value for the device under test.
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